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LATEST NEWS FROM LASER QUANTUM

Month: March 2015

Whitepaper – Sub-nm layer measurements using ASOPS and laser induced ultrasound

The measurement of thin film layer thickness in industries such as silicon wafer manufacture requires the highest accuracy, resolution and speed, all in a non-invasive, non-destructive method. Here we report on laser-induced ultrasound using two frequency offset high repetition rate lasers to study layer thickness to a sub-nm resolution. Read the whitepaper here.


March 6th, 2015 | Company News

The first photograph of light as a wave and a particle

Einstein showed us in 1909 that light can behave both as a particle and a wave, but we are yet to see a photograph of light in both states simultaneously, until now! Scientists at the École polytechnique Fédérale de Lausanne, Switzerland, have managed to capture the image of light exhibiting both properties. The breakthrough work […]


March 5th, 2015 | Company News

Laser Quantum at Photonex South Roadshow

Join Laser Quantum’s Justine Bentley at Photonex South Roadshow, table S33, on Monday 9th March. This free event brings together the UK’s top photonics technology supplier companies, leading researchers and invited speakers for a one-day event. Justine will be exhibiting our opus 6W and ventus 473nm500mW lasers and will be happy to chat to you […]


March 2nd, 2015 | Company News

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